DOST nanoscale analysis facility strengthens the Philippines’ semiconductor sector by enabling advanced material testing and defect detection, helping manufacturers improve product quality and reduce production delays.

The Department of Science and Technology (DOST) recently unveiled equipment that can analyze materials and detect defects at a nanoscale level, helping companies improve product quality and reduce delays in the production of electronic devices like smartphones and laptops. 

The newly acquired Field Emission Scanning Electron Microscope (FE-SEM), housed at the Advanced Device and Materials Testing Laboratory (ADMATEL) in Bicutan, Taguig will be used with the Energy Dispersive X-ray (EDX) and Electron Backscatter Diffraction (EBSD) Analyzer, to expand ADMATEL’s capabilities in failure analysis and material characterization. 

“Investing in a FE-SEM is a strategic step toward strengthening the country’s advanced research and manufacturing capabilities. With its ability to reveal materials at the nanoscale, this technology enables precise characterization of nanoparticles, nanotubes, and advanced materials, as well as detailed analysis of thin films and multi-layer coatings essential to modern technologies,” shared DOST Secretary Renato U. Solidum, Jr.

The equipment is expected to serve a broad range of users, including semiconductor companies, academic institutions, and research organizations. Beyond electronics, the FE-SEM equipment can also analyze biological samples and advanced nanomaterials, making it a versatile tool for multidisciplinary research.

“The launching of this new equipment strengthens our country’s capacity to support the semiconductor and electronic sectors, as well as advanced materials in research and development industries. It empowers our local companies not just to fix problems, but to design better, more reliable products from the start. In today’s fast-changing technological landscape, the semiconductor and electronics industries are essential engines of economic growth,” said Sec. Solidum.

“As electronic devices become smaller and more efficient, we need equipment that can analyze materials at a much smaller scale,” said Engr. John Kenneth Valerio, project leader of PINAS-SEM. “This technology allows us to capture extremely high-magnification images and detect even the smallest defects or contaminants that affect product performance.”

According to Dr. Dan Lachica, President of Semiconductor and Electronics Industries in the Philippines Foundation, Inc. (SEIPI). “The FE-SEM helps enable precise examination of device structures, interfaces, materials behavior, and process-induced variations that may directly affect performance and reliability. It plays an important role in identifying defects, supporting root cause analysis, process improvement, validating processes, and helping resolve complex reliability issues,” he added.

“Through this latest FE-SEM, we can now support a wide range of critical applications. These include identifying defects in semiconductor devices, analyzing microstructural failures in electronic components, and detecting contamination at a nano scale, resulting in improving product reliability and quality assurance processes,” said DOST Undersecretary for R&D Leah J. Buendia. 

ADMATEL remains committed to serving local and international clients with quality test services. Researchers, industry partners, and institutions interested in advanced materials characterization and semiconductor analysis are encouraged to collaborate and contact the MSD-ADMATEL of the DOST-ITDI in Bicutan, Taguig City.

It is one of the initiatives of the Department of Science and Technology (DOST) aimed at providing science-based, innovative, and inclusive solutions across four strategic pillars: human well-being, wealth creation, wealth protection, and sustainability. These pillars embody the mantra OneDOST4U: Solutions and Opportunities for All. (PR)

Photo caption: Engr. John Kenneth Valerio, PINAS-SEM Project Leader, demonstrates the capabilities of the newly acquired Field Emission Scanning Electron Microscope (FE-SEM) at DOST-ITDI’s Advanced Device and Materials Testing Laboratory